Greg Edlund’s career in signal integrity began in 1988 at Supercomputer Systems, Inc., where he simulated and measured timing characteristics of bipolar embedded RAMs used in the computer’s vector registers. Since then, he has participated in the development and testing of nine other high-performance computing platforms for Cray Research, Inc., Digital Equipment Corp., and IBM Corp. He has had the good fortune of learning from many talented engineers while focusing his attention on modeling, simulation, and measurement of IO circuits and interconnect components. A solid physical foundation and practical engineering experience combine to form a valuable perspective on optimizing performance, reliability, and cost.