PINAKI MAZUMDER is Professor in the Department of Electrical Engineering and Computer Science at The University of Michigan, Ann Arbor. He has worked for over six years at AT&T Bell Laboratories (USA), NTT (Japan), and BEL (India). He has coauthored a book entitled Testing and Testable Design of High-Density Random-Access Memories and has published over 100 archival papers on VLSI testing, physical design automation, and high-speed circuit design.
ELIZABETH M. RUDNICK is Assistant Professor at the Center for Reliable and High-Performance Computing and the Department of Electrical and Computer Engineering, University of Illinois, Urbana. She has worked at Motorola, Sunrise Test Systems, and AMD, specializing in design verification, test generation, and electronic design automation.